Scanning electron microscopy of III-nitrides

© 2015 Stefano Vespucci

© 2015 Stefano Vespucci

Welcome to the website for the research project “Nanoscale characterisation of nitride semiconductor thin films using electron backscatter diffraction, electron channelling contrast imaging, cathodoluminescence and electron beam induced current”.

This work is a collaboration between research groups at the Universities of Strathclyde, Oxford, Nottingham, Sheffield and Bath, and Imperial College.

The project is funded by a the UK’s Engineering and Physical Sciences Research Council (EPSRC) through the following grants. Click on the grant numbers to view relevant project information on EPSRC’s Grants on the Web site: