Publications

A list of journal articles, conference proceedings and published abstracts which have resulted from the work carried out in this project. The complete list may also be downloaded as a BibTeX database.

2016

  • [DOI] E. V. Lutsenko, M. V. Rzheutski, V. N. Pavlovskii, G. P. Yablonskii, M. Alanzi, A. Hamidalddin, A. Alyamani, C. Mauder, H. Kalisch, B. Reuters, M. Heuken, A. Vescan, G. Naresh-Kumar, and C. Trager-Cowan, “Optical and structural properties of GaN epitaxial layers on LiAlO₂ substrates and their correlation with basal-plane stacking faults,” Journal of Crystal Growth, vol. 434, pp. 62-66, 2016.
    [Bibtex]
    @Article{Lutsenko2016JCG434,
    Title = {Optical and structural properties of {GaN} epitaxial layers on {LiAlO₂} substrates and their correlation with basal-plane stacking faults},
    Author = {E. V. Lutsenko and M. V. Rzheutski and V. N. Pavlovskii and G. P. Yablonskii and M. Alanzi and A. Hamidalddin and A. Alyamani and C. Mauder and H. Kalisch and B. Reuters and M. Heuken and A. Vescan and G. Naresh-Kumar and C. Trager-Cowan},
    Journal = {Journal of Crystal Growth},
    Year = {2016},
    Pages = {62-66},
    Volume = {434},
    Doi = {10.1016/j.jcrysgro.2015.10.036},
    Owner = {paul},
    Timestamp = {2016.01.20}
    }
  • [PDF] [DOI] G. Naresh-Kumar, D. Thomson, M. Nouf-Allehiani, J. Bruckbauer, P. R. Edwards, B. Hourahine, and C. Trager-Cowan, “Electron channelling contrast imaging for III-nitride thin film structures,” Materials Science in Semiconductor Processing, vol. 47, pp. 44-50, 2016.
    [Bibtex]
    @Article{Naresh-Kumar2016MSSP47,
    author = {G. Naresh-Kumar and D. Thomson and M. Nouf-Allehiani and J. Bruckbauer and P. R. Edwards and B. Hourahine and C. Trager-Cowan},
    title = {Electron channelling contrast imaging for {III}-nitride thin film structures},
    journal = {Materials Science in Semiconductor Processing},
    year = {2016},
    volume = {47},
    pages = {44-50},
    doi = {10.1016/j.mssp.2016.02.007},
    owner = {paul},
    timestamp = {2015.11.26}
    }

2015

  • [PDF] [DOI] G. Kusch, M. Nouf-Allehiani, F. Mehnke, C. Kuhn, P. R. Edwards, T. Wernicke, A. Knauer, V. Kueller, M. Weyers, G. Naresh-Kumar, M. Kneissl, C. Trager-Cowan, and R. W. Martin, “Spatial clustering of defect luminescence centers in Si-doped low resistivity Al₀.₈₂Ga₀.₁₈N,” Applied Physics Letters, vol. 107, p. 72103, 2015.
    [Bibtex]
    @Article{Kusch2015APL107,
    Title = {Spatial clustering of defect luminescence centers in {Si}-doped low resistivity {Al₀.₈₂Ga₀.₁₈N}},
    Author = {G. Kusch and M. Nouf-Allehiani and F. Mehnke and C. Kuhn and P. R. Edwards and T. Wernicke and A. Knauer and V. Kueller and M. Weyers and G. Naresh-Kumar and M. Kneissl and C. Trager-Cowan and R. W. Martin},
    Journal = {Applied Physics Letters},
    Year = {2015},
    Pages = {072103},
    Volume = {107},
    Doi = {10.1063/1.4928667},
    Owner = {paul},
    Timestamp = {2015.07.14}
    }
  • [PDF] [DOI] S. Vespucci, A. Winkelmann, G. Naresh-Kumar, K. P. Mingard, D. Maneuski, P. R. Edwards, A. P. Day, V. O’Shea, and C. Trager-Cowan, “Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns,” Physical Review B, vol. 92, p. 205301, 2015.
    [Bibtex]
    @Article{Vespucci2015PRB92,
    Title = {Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns},
    Author = {S. Vespucci and A. Winkelmann and G. Naresh-Kumar and K. P. Mingard and D. Maneuski and P. R. Edwards and A. P. Day and V. O'Shea and C. Trager-Cowan},
    Journal = {Physical Review B},
    Year = {2015},
    Pages = {205301},
    Volume = {92},
    Doi = {10.1103/PhysRevB.92.205301},
    Owner = {paul},
    Timestamp = {2015.03.24}
    }
  • [DOI] A. Vilalta-Clemente, J. Jiang, B. Britton, D. M. Collins, and A. Wilkinson, “Analysis of dislocation densities using high resolution electron backscatter diffraction,” Microscopy and Microanalysis, vol. 21, pp. 1891-1892, 2015.
    [Bibtex]
    @Article{Vilalta-Clemente2015MM21,
    Title = {Analysis of dislocation densities using high resolution electron backscatter diffraction},
    Author = {A. Vilalta-Clemente and J. Jiang and B. Britton and D. M. Collins and A. Wilkinson},
    Journal = {Microscopy and Microanalysis},
    Year = {2015},
    Pages = {1891-1892},
    Volume = {21},
    Doi = {10.1017/S1431927615010235},
    Owner = {paul},
    Timestamp = {2015.08.21}
    }
  • [DOI] A. Vilalta-Clemente, G. Naresh-Kumar, M. Nouf-Allehiani, P. J. Parbrook, E. D. Le B, D. Allsopp, P. A. Shields, C. Trager-Cowan, and A. Wilkinson, “High-resolution electron backscatter diffraction in III-nitride semiconductors,” Microscopy and Microanalysis, vol. 21, pp. 2217-2218, 2015.
    [Bibtex]
    @Article{Vilalta-Clemente2015MM21a,
    Title = {High-resolution electron backscatter diffraction in III-nitride semiconductors},
    Author = {A. Vilalta-Clemente and G. Naresh-Kumar and M. Nouf-Allehiani and P. J. Parbrook and E. D. {Le B}oulbar and D. Allsopp and P. A. Shields and C. Trager-Cowan and A. Wilkinson},
    Journal = {Microscopy and Microanalysis},
    Year = {2015},
    Pages = {2217-2218},
    Volume = {21},
    Doi = {10.1017/S1431927615011861},
    Owner = {paul},
    Timestamp = {2015.08.21}
    }

2014

  • [DOI] P. R. Edwards, M. J. Wallace, G. Kusch, G. Naresh-Kumar, J. Bruckbauer, C. Trager-Cowan, K. P. O’Donnell, and R. W. Martin, “Cathodoluminescence hyperspectral imaging of nitride semiconductors: introducing new variables,” Microscopy and Microanalysis, vol. 20, pp. 906-907, 2014.
    [Bibtex]
    @Article{Edwards2014MM20,
    Title = {Cathodoluminescence hyperspectral imaging of nitride semiconductors: introducing new variables},
    Author = {Edwards,Paul R. and Wallace,Michael J. and Kusch,Gunnar and Naresh-Kumar,Gunasekar and Bruckbauer,Jochen and Trager-Cowan,Carol and O'Donnell,Kevin P. and Martin,Robert W.},
    Journal = {Microscopy and Microanalysis},
    Year = {2014},
    Pages = {906-907},
    Volume = {20},
    Doi = {10.1017/S1431927614006254},
    ISSN = {1435-8115},
    Issue = {Supplement S3},
    Numpages = {2},
    Owner = {paul},
    Timestamp = {2014.09.17}
    }
  • [PDF] [DOI] G. Naresh-Kumar, A. Vilalta-Clemente, S. Pandey, D. Skuridina, H. Behmenburg, P. Gamarra, G. Patriarche, I. Vickridge, M. A. di Forte-Poisson, P. Vogt, M. Kneissl, M. Morales, P. Ruterana, A. Cavallini, D. Cavalcoli, C. Giesen, M. Heuken, and C. Trager-Cowan, “Multicharacterization approach for studying InAl(Ga)N/Al(Ga)N/GaN heterostructures for high electron mobility transistors,” AIP Advances, vol. 4, p. 127101, 2014.
    [Bibtex]
    @Article{Naresh-Kumar2014AIPA4,
    Title = {Multicharacterization approach for studying {InAl(Ga)N/Al(Ga)N/GaN} heterostructures for high electron mobility transistors},
    Author = {G. Naresh-Kumar and A. Vilalta-Clemente and S. Pandey and D. Skuridina and H. Behmenburg and P. Gamarra and G. Patriarche and I. Vickridge and di Forte-Poisson, M. A. and P. Vogt and M. Kneissl and M. Morales and P. Ruterana and A. Cavallini and D. Cavalcoli and C. Giesen and M. Heuken and C. Trager-Cowan},
    Journal = {AIP Advances},
    Year = {2014},
    Note = {Date of Acceptance: 19/11/2014},
    Pages = {127101},
    Volume = {4},
    Doi = {10.1063/1.4903227},
    ISSN = {2158-3226},
    Keywords = {Ga incorporation, III-V semiconductors, Rutherford backscattering, Physics, Electronic, Optical and Magnetic Materials, Physics and Astronomy (miscellaneous)},
    Owner = {paul},
    Timestamp = {2015.08.13}
    }
  • [PDF] [DOI] G. Naresh-Kumar, J. Bruckbauer, P. R. Edwards, S. Kraeusel, B. Hourahine, R. W. Martin, M. J. Kappers, M. A. Moram, S. Lovelock, R. A. Oliver, C. J. Humphreys, and C. Trager-Cowan, “Coincident electron channeling and cathodoluminescence studies of threading dislocations in GaN,” Microscopy and Microanalysis, vol. 20, pp. 55-60, 2014.
    [Bibtex]
    @Article{Naresh-Kumar2014MM20,
    Title = {Coincident electron channeling and cathodoluminescence studies of threading dislocations in {GaN}},
    Author = {G. Naresh-Kumar and J. Bruckbauer and P. R. Edwards and S. Kraeusel and B. Hourahine and R. W. Martin and M. J. Kappers and M. A. Moram and S. Lovelock and R. A. Oliver and C. J. Humphreys and C. Trager-Cowan},
    Journal = {Microscopy and Microanalysis},
    Year = {2014},
    Pages = {55-60},
    Volume = {20},
    Doi = {10.1017/S1431927613013755},
    Owner = {paul},
    Timestamp = {2014.01.06}
    }
  • [DOI] C. Trager-Cowan, G. Naresh-Kumar, N. Allehiani, S. Kraeusel, B. Hourahine, S. Vespucci, D. Thomson, J. Bruckbauer, G. Kusch, P. R. Edwards, R. W. Martin, C. Mauder, A. P. Day, A. Winkelmann, A. Vilalta-Clemente, A. J. Wilkinson, P. J. Parbrook, M. J. Kappers, M. A. Moram, R. A. Oliver, C. J. Humphreys, P. Shields, E. D. Le Boulbar, D. Maneuski, V. O’Shea, and K. P. Mingard, “Electron channeling contrast imaging of defects in III-nitride semiconductors,” Microscopy and Microanalysis, vol. 20, pp. 1024-1025, 2014.
    [Bibtex]
    @Article{Trager-Cowan2014MM20,
    Title = {Electron channeling contrast imaging of defects in {III}-nitride semiconductors},
    Author = {Trager-Cowan,C. and Naresh-Kumar,G. and Allehiani,N. and Kraeusel,S. and Hourahine,B. and Vespucci,S. and Thomson,D. and Bruckbauer,J. and Kusch,G. and Edwards,P. R. and Martin,R. W. and Mauder,C. and Day,A. P. and Winkelmann,A. and Vilalta-Clemente,A. and Wilkinson,A. J. and Parbrook,P. J. and Kappers,M. J. and Moram,M. A. and Oliver,R. A. and Humphreys,C. J. and Shields,P. and Le Boulbar,E. D. and Maneuski,D. and O'Shea,V. and Mingard,K. P.},
    Journal = {Microscopy and Microanalysis},
    Year = {2014},
    Pages = {1024-1025},
    Volume = {20},
    Doi = {10.1017/S1431927614006849},
    ISSN = {1435-8115},
    Issue = {Supplement S3},
    Numpages = {2},
    Owner = {paul},
    Timestamp = {2014.09.17}
    }
  • [DOI] A. J. Wilkinson, E. Tarleton, A. Vilalta-Clemente, J. Jiang, B. T. Britton, and D. M. Collins, “Measurement of probability distributions for internal stresses in dislocated crystals,” Applied Physics Letters, vol. 105, p. 181907, 2014.
    [Bibtex]
    @Article{Wilkinson2014APL105,
    Title = {Measurement of probability distributions for internal stresses in dislocated crystals},
    Author = {Wilkinson, Angus J. and Tarleton, Edmund and Vilalta-Clemente, Arantxa and Jiang, Jun and Britton, T. Benjamin and Collins, David M.},
    Journal = {Applied Physics Letters},
    Year = {2014},
    Pages = {181907},
    Volume = {105},
    Doi = {10.1063/1.4901219},
    Owner = {paul},
    Timestamp = {2015.08.14}
    }

2013

  • [DOI] S. Nagarajan, O. Svensk, M. Ali, G. Naresh-Kumar, C. Trager-Cowan, S. Suihkonen, M. Sopanen, and H. and Lipsanen, “Stress distribution of GaN layer grown on micro-pillar patterned GaN templates,” Applied Physics Letters, vol. 103, p. 12102, 2013.
    [Bibtex]
    @Article{Nagarajan2013APL103,
    Title = {Stress distribution of {GaN} layer grown on micro-pillar patterned {GaN} templates},
    Author = {S. Nagarajan and O. Svensk and M. Ali and G. Naresh-Kumar and C. Trager-Cowan and S. Suihkonen and M. Sopanen and and H. Lipsanen},
    Journal = {Applied Physics Letters},
    Year = {2013},
    Pages = {012102},
    Volume = {103},
    Doi = {10.1063/1.4813077},
    Owner = {paul},
    Timestamp = {2016.01.20}
    }
  • [DOI] G. Naresh-Kumar, C. Mauder, K. R. Wang, S. Kraeusel, J. Bruckbauer, P. R. Edwards, B. Hourahine, H. Kalisch, A. Vescan, C. Giesen, M. Heuken, A. Trampert, A. P. Day, and C. Trager-Cowan, “Electron channeling contrast imaging studies of non-polar nitrides using a scanning electron microscope,” Applied Physics Letters, vol. 102, p. 142103, 2013.
    [Bibtex]
    @Article{Naresh-Kumar2013APL102,
    Title = {Electron channeling contrast imaging studies of non-polar nitrides using a scanning electron microscope},
    Author = {Naresh-Kumar, G. and Mauder, C. and Wang, K. R. and Kraeusel, S. and Bruckbauer, J. and Edwards, P. R. and Hourahine, B. and Kalisch, H. and Vescan, A. and Giesen, C. and Heuken, M. and Trampert, A. and Day, A. P. and Trager-Cowan, C.},
    Journal = {Applied Physics Letters},
    Year = {2013},
    Pages = {142103},
    Volume = {102},
    Doi = {10.1063/1.4801469},
    Owner = {Paul},
    Timestamp = {2013.03.27}
    }

2012

  • [DOI] C. Trager-Cowan, G. Naresh-Kumar, B. Hourahine, P. R. Edwards, J. Bruckbauer, R. W. Martin, C. Mauder, A. P. Day, G. England, A. Winkelmann, P. J. Parbrook, and A. Wilkinson, “Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films,” Microscopy and Microanalysis, vol. 18, pp. 684-685, 2012.
    [Bibtex]
    @Article{Trager-Cowan2012MM18,
    Title = {Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films},
    Author = {Trager-Cowan,C. and Naresh-Kumar,G. and Hourahine,B. and Edwards,P.R. and Bruckbauer,J. and Martin,R.W. and Mauder,C. and Day,A.P. and England,G. and Winkelmann,A. and Parbrook,P.J. and Wilkinson,A.},
    Journal = {Microscopy and Microanalysis},
    Year = {2012},
    Pages = {684--685},
    Volume = {18},
    Doi = {10.1017/S1431927612005272},
    ISSN = {1435-8115},
    Issue = {Supplement S2},
    Numpages = {2},
    Owner = {Paul},
    Timestamp = {2013.10.15}
    }