© 2011 Naresh Kumar
- Scanning electron microscopy (SEM)
- Electron backscatter diffraction (EBSD)
- Electron channelling contrast imaging (ECCI)
- Cathodoluminescence (CL)
- Electron beam-induced current (EBIC)
Techniques
Scanning electron microscopy of nitrides
Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC
