Posters

A selection of research posters presented by project members at scientific conferences and meetings. Click on the poster images to download a PDF version.

elenaposter300
Theoretical model of contrast produced by surface normal TDs as observed by ECCI
Presented by Elena Pascal at EBSD 2016, Manchester, UK


Nouf_ICNSposter_2013
Quantitative microstructural analysis of nitride thin films in the scanning electron microscope
Presented by Nouf Allehiani at XXIV International Materials Research Congress (IMRC) 2015, Cancun, Mexico


Poster_Vespucci
Direct electron imaging of energy filtered EBSD patterns using a CMOS hybrid pixel detector
Presented by Stefano Vespucci at 17th International Workshop on Radiation Imaging Detectors (iWoRiD) 2015, Hamburg, Germany


Mapping of strain and distribution of dislocations by EBSD and ECCI-NK poster
Mapping of the strain and distribution of dislocations in InAlN based HEMTs using EBSD and ECCI
Presented by Dr Naresh Kumar at International Workshop on Nitride Semiconductors (IWN) 2014, Wrocław, Poland

Multicharacterisation approach NK poster
Multicharacterization approach for studying InAl(Ga)N/Al(Ga)N/GaN heterostructures for HEMTs
Presented by Dr Naresh Kumar at International Workshop on Nitride Semiconductors (IWN) 2014, Wrocław, Poland


bruckbauer_icns2013_dislocations_A1
Coincident cathodoluminescence and electron channelling contrast imaging of threading dislocations in GaN
Presented by Dr Jochen Bruckbauer at International Conference on Nitride Semiconductors (ICNS-10) 2013, Washington DC, USA


GADEST_2013_poster_AVC
Stress mapping and dislocation density distribution on micro-pillar patterned GaN templates
Presented by Dr Arantxa Vilalta-Clemente at Gettering and Defect Engineering in Semiconductor Technology (GADEST) 2013, Oxford, UK

UK_Semiconductor2013_Last_version-1
Electron backscatter diffraction analysis of tilt, twist and strain variations in MOVPE GaN on sapphire
Presented by Dr Arantxa Vilalta-Clemente at UK Semiconductors 2013, Sheffield, UK


naresh poster for UKNC
Applications of ECCI for characterising nitride semiconductor thin films in a scanning electron microscope
Presented by Dr Naresh Kumar at UK Semiconductors 2012, Sheffield, UK